Title :
Analysis of RF plasma using electrical equivalent circuit
Author :
Hirayama, Masaki ; Ino, Kazuhide ; Ohmi, Tadahiro
Author_Institution :
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
Abstract :
The electrical equivalent circuits of RF plasmas have been obtained by use of the accurate probe measurements and HSPICE simulation. Using the obtained equivalent circuits, the electrical characteristics of SF6 and Ar plasmas have been compared. The SF6 plasma displays sinusoidal waveforms of the plasma potential for the capacitive sheath characteristics. On the other hand, in Ar plasma the displacement current through the grounded electrode sheath is comparable to the conduction current. The plasma potential in Ar plasma has significantly higher harmonics for the nonlinear characteristics of the grounded electrode sheath. This analysis method serves as an essential tool for modelling RF plasmas
Keywords :
SPICE; digital simulation; equivalent circuits; integrated circuit manufacture; plasma applications; probes; semiconductor process modelling; Ar; HSPICE simulation; RF plasma; SF6; capacitive sheath characteristics; displacement current; electrical equivalent circuit; grounded electrode sheath; nonlinear characteristics; plasma potential; probe measurements; semiconductor manufacturing; sinusoidal waveforms; Argon; Electrodes; Equivalent circuits; Plasma displays; Plasma measurements; Plasma properties; Plasma sheaths; Plasma simulation; Plasma waves; Radio frequency;
Conference_Titel :
Semiconductor Manufacturing, 1995., IEEE/UCS/SEMI International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2928-7
DOI :
10.1109/ISSM.1995.524408