• DocumentCode
    3353258
  • Title

    Advanced water purification system for sub-half-micron devices

  • Author

    Ban, Cozy ; Sato, Kazunao ; Hirayama, Makoto

  • Author_Institution
    Mitsubishi Electr. Corp., Japan
  • fYear
    1995
  • fDate
    17-19 Sep 1995
  • Firstpage
    292
  • Abstract
    Summary form only given. Sub-half-micron devices have fine patterns and thin films. Therefore, the wafer surface is very sensitive to contamination. It is important to keep the wafer surface clean for producing high yield. Purified water plays a significant role in cleaning silicon wafers, because wafers are rinsed with water at the end of every process. So water, the final cleaning agent, has to be highly purified. In current water purifying systems, it is difficult to accomplish the water quality targets for sub-half-micron devices. We developed a new water purification system with three new technological innovations: the ion exchange resins capable of absorbing particles, the unit to ionize silicate impurities, and a two-stage vacuum tower. Optimal organization of these technologies makes it possible to achieve the highest purity with reduced cost. We present the technologies on effective removal of particles, efficient elimination of silicate impurities, and strict control of dissolved oxygen
  • Keywords
    VLSI; integrated circuit technology; integrated circuit yield; ion exchange; surface cleaning; water treatment; Si; cleaning agent; dissolved oxygen; ion exchange resins; silicate impurities; sub-half-micron devices; two-stage vacuum tower; wafer surface cleaning; water purification system; water quality targets; yield; Impurities; Purification; Resins; Silicon; Surface cleaning; Surface contamination; Technological innovation; Thin film devices; Vacuum systems; Water pollution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 1995., IEEE/UCS/SEMI International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-2928-7
  • Type

    conf

  • DOI
    10.1109/ISSM.1995.524410
  • Filename
    524410