Title :
Development of the GridPix detector for dual phase noble gas time projection chambers
Author :
Alfonsi, M. ; van Bakel, N. ; Decowski, M.P. ; Hemink, G. ; van der Graaf, H. ; Schon, R.
Author_Institution :
Nikhef, Amsterdam, Netherlands
Abstract :
GridPix is a gas-filled detector with an aluminum mesh stretched 50 μm above the Timepix CMOS pixel chip. This defines a high electric field where gas amplification occurs. A feasibility study is currently ongoing at Nikhef for the application of the GridPix technology as a charge sensitive device in a dual phase noble gas Time Projection Chamber (TPC), within the framework of the DARWIN dark matter design study. The application in dual phase argon or xenon TPCs implies several technological challenges, such as the survival of the device at cryogenic temperature as well as the operation in a pure noble gas atmosphere without discharges. The equipment for tests at liquid nitrogen temperature and a gain measurement station have been built at Nikhef and the results are reported. Moreover, the first test of the device in a dual phase argon TPC has been performed in collaboration with ETH Zurich.
Keywords :
CMOS digital integrated circuits; argon; cryogenics; dark matter; gain measurement; nuclear electronics; semiconductor counters; time projection chambers; xenon; DARWIN dark matter design study; GridPix detector; GridPix technology; Timepix CMOS pixel chip; aluminum mesh; charge sensitive device; cryogenic temperature; dual phase argon TPC; dual phase noble gas; dual phase xenon TPC; electric field; gain measurement station; gas amplification; gas-filled detector; liquid nitrogen temperature; pure noble gas atmosphere; time projection chambers; wavelength 50 mum; Argon; Detectors; Ions;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154446