DocumentCode
3353294
Title
Electrical and reliability properties of isotropic conductive adhesives (ICAs) on immersion silver printed wiring boards (PWBs)
Author
Lee, Jeahuck ; Cho, C.S. ; Morris, James E.
Author_Institution
Dept. of Electr. & Comput. Eng., Portland State Univ., Portland, OR
fYear
2007
fDate
19-22 Nov. 2007
Firstpage
1
Lastpage
4
Abstract
To completely eliminate lead (Pb) from electronics, the printed wiring board (PWB) must also change from hot-air- leveled solder (SnPb) to alternative metallic finishes, such as immersion-silver (Ag), immersion-tin (Sn), electroless nickel (Ni)/immersion-gold (Au) and organic solderability preservative (OSP). Especially, immersion-Ag is one of the leading Pb-free final finish choices for many OEMs in the telecommunications, computer, automotive and consumer electronics industries, because of its excellent properties and reasonable cost. This paper presents the electrical properties of Ag epoxy composite isotropic conductive adhesives (ICAs) materials on Cu-finished and immersion-Ag finished PWBs, as solder replacements for SMT or flip chip technologies. All PWBs were subjected to 85degC/85% relative humidity (RH) aging testing, with junction resistance monitored for comparison of the immersion-Ag board to the Cu-finished board as a control. We expected that the corrosion potential, which is one of main causes to degrade conductivity between ICAs and PWB, should be eliminated by the use of Ag contact pads with the Ag epoxy composite ICAs materials. Not only is the junction resistance of immersion-Ag finished boards lower than that of Cu finished boards, but its junction resistance changes are smaller than those of Cu-finished boards, as expected.
Keywords
circuit reliability; conductive adhesives; printed circuits; solders; electrical properties; electroless nickel; hot-air-leveled solder; immersion silver printed wiring boards; immersion-gold; immersion-silver; immersion-tin; isotropic conductive adhesives materials; lead; organic solderability preservative; reliability properties; Composite materials; Conducting materials; Conductive adhesives; Gold; Independent component analysis; Lead; Nickel; Silver; Tin; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging, 2007. EMAP 2007. International Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-1909-8
Electronic_ISBN
978-1-4244-1910-4
Type
conf
DOI
10.1109/EMAP.2007.4510285
Filename
4510285
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