Title :
New simplified measuring method for birefringence distribution
Author :
Gomia, Kenji ; Suzukib, Tomoyuki ; Ichinosea, Kensuke ; Niitsu, Yoshihiro
Author_Institution :
Dept. of Mech. Eng., Tokyo Denki Univ., Tokyo
Abstract :
This paper introduces the principles and execution of a new method of measuring for low-level retardation distribution, which requires only three phase-shifting data. To verify this method experimentally, a precise crystal wave plate having nominal retardation plusmn tolerance of 79.1plusmn3.5 was used as a specimen. The experimental results for the proposed method are quantitatively compared with the retardation of the specimen and the usefulness of the principle is presented.
Keywords :
mechanical birefringence; birefringence distribution; crystal wave plate; low-level retardation distribution; nominal retardation; phase-shifting data; Birefringence; Instruments; Mechanical variables measurement; Optical polarization; Optical retarders; Optoelectronic devices; Phase measurement; Production; Residual stresses; Semiconductor lasers;
Conference_Titel :
Electronic Materials and Packaging, 2007. EMAP 2007. International Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-1909-8
Electronic_ISBN :
978-1-4244-1910-4
DOI :
10.1109/EMAP.2007.4510324
