DocumentCode :
3353865
Title :
MEMS packaging technology using a cavity structure for mass production
Author :
Lee, J.S. ; Faheem, F. ; Kim, J.T. ; Jung, J.D. ; Kim, J.Y. ; Kim, J.D. ; Lee, C.H.
Author_Institution :
R&D Center, Amkor Technol. Korea Inc., Seoul
fYear :
2007
fDate :
19-22 Nov. 2007
Firstpage :
1
Lastpage :
6
Abstract :
Lower cost package for microelectromechanical systems (MEMS) have been required, because the cost portion of the MEMS package is more than 30% of the cost of a MEMS product. For the reason, cost effective MEMS packaging platforms are proposed in this paper for high volume production. Two package platforms are developed using an epoxy molding compound (EMC) onto copper (Cu) pre-plated lead frames (L/F). One is a cavity wall type with attaching a flat lid. The other is an in-frame type with attaching a folded cap lid. Finite element method (FEM) numerical modeling is performed to anticipate the mechanical warpage and stress of the packages. The finally assembled packages are tested for wire pulling, lid pulling, hermetic test, and reliability tests. The wire bonding strength was improved in about 40% using plasma cleaning before wire bonding. Through a lid pulling test, the lid bonding strength of 2.40 kgf in average was obtained using an epoxy adhesive. Finally, all samples of the packages passed the reliability tests of the TC, HAST and HST, standardized by JEDEC (joint electron device engineering council). Also, this cavity package showed excellent hermeticity through leak test.
Keywords :
electronics packaging; finite element analysis; mass production; micromechanical devices; EMC; FEM; JEDEC; MEMS packaging technology; copper; epoxy molding compound; finite element method; joint electron device engineering council; mass production; microelectromechanical systems; plasma cleaning; preplated lead frames; wire bonding; Bonding; Copper; Costs; Joining processes; Mass production; Microelectromechanical systems; Micromechanical devices; Packaging; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2007. EMAP 2007. International Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-1909-8
Electronic_ISBN :
978-1-4244-1910-4
Type :
conf
DOI :
10.1109/EMAP.2007.4510329
Filename :
4510329
Link To Document :
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