Combined electroluminescence and charge profile measurements in polyethylene naphthalate

Author

Augé, J.L. ; Teyssedre, G. ; Laurent, C. ; Ditchi, T. ; Hole, S.

Author_Institution

Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France

Volume

2

fYear

1999

fDate

1999

Firstpage

516

Abstract

Under DC stress, electroluminescence in polyethylene naphthalate films is stable, current-proportional, above a threshold field of 150 kV/mm. At this field level, the luminescence is thought to be triggered by impact excitation and/or ionization of the luminescent centers by hot electrons, or, alternatively, by electron and hole injection, migration and recombination. Investigation of the internal space charge distribution versus field is believed to constitute a relevant approach to discuss the excitation process

Keywords

electroluminescence; electron impact ionisation; hot carriers; insulating thin films; polyethylene insulation; DC stress; charge profile; electroluminescence; electron injection; electron migration; electron recombination; excitation process; hole injection; hot electrons; impact excitation; internal space charge distribution; ionization; luminescent centers; polyethylene naphthalate; Charge carrier processes; Charge measurement; Current measurement; Electroluminescence; Ionization; Luminescence; Plastic films; Polyethylene; Spontaneous emission; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on

Conference_Location

Austin, TX

Print_ISBN

0-7803-5414-1

Type

conf

DOI

10.1109/CEIDP.1999.807849

Filename

807849