DocumentCode :
3354256
Title :
Classification of simulated elastograms based on texture features
Author :
Kehtarnavaz, N. ; Araabi, B.N. ; Kallel, F. ; Ophir, J.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fYear :
2001
fDate :
2001
Firstpage :
461
Lastpage :
466
Abstract :
Elastography is a new imaging modality which provides an image of tissue elastic properties. Simulated elastograms are used to study the ability of textural features to discriminate between abnormalities with different levels of hardness and density. Elastograms are simulated for different signal processing parameters as well as for a non-uniform stress field. 15 selected texture features are extracted. The Gaussian classifier does not perform well due to the complexity of clusters. Hence, a neural network classifier is trained and tested to discriminate between the classes. The results indicate that the texture features perform well under variations of the signal processing parameters and non-uniformity of the applied stress field. This simulation study provides a guiding mechanism to discriminate between malignant and benign tissue abnormalities once clinical data becomes available
Keywords :
biomechanics; biomedical ultrasonics; density; elasticity; feature extraction; hardness; image classification; image texture; medical image processing; neural nets; simulation; stress effects; Gaussian classifier; abnormality discrimination; benign tissue abnormalities; clinical data; cluster complexity; density; elastography; hardness; imaging modality; malignant tissue; neural network classifier; nonuniform stress field; signal processing parameters; simulated elastogram classification; texture feature extraction; tissue elastic properties; Cancer; Capacitive sensors; Image coding; Medical simulation; Neural networks; Radio frequency; Signal processing; Stress; Testing; Ultrasonic imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Based Medical Systems, 2001. CBMS 2001. Proceedings. 14th IEEE Symposium on
Conference_Location :
Bethesda, MD
ISSN :
1063-7125
Print_ISBN :
0-7695-1004-3
Type :
conf
DOI :
10.1109/CBMS.2001.941762
Filename :
941762
Link To Document :
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