Title :
A new statistical approach for fault-tolerant VLSI systems
Author_Institution :
IBM Technol. Products, Essex Junction, VT, USA
Abstract :
A novel approach to the statistics of fault-tolerant VLSI systems is presented by compounding binomial distributions with a beta distribution. This technique was discovered in the analysis of fault-tolerant dynamic random-access memory (DRAM) chips. Manufacturing data supporting this method are shown and the application of the approach to standard fault-tolerance schemes is described. Special forms of these statistics for computer calculations are also discussed and examples are given.<>
Keywords :
DRAM chips; VLSI; fault tolerant computing; beta distribution; binomial distributions; computer calculations; fault-tolerant VLSI systems; fault-tolerant dynamic random-access memory; statistical approach; Circuit faults; Computer aided manufacturing; Fault tolerance; Fault tolerant systems; Integrated circuit manufacture; Integrated circuit yield; Pulp manufacturing; Statistical distributions; Very large scale integration; Yield estimation;
Conference_Titel :
Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-8186-2875-8
DOI :
10.1109/FTCS.1992.243565
