Title :
Recovery voltage measurements on XLPE cables
Author :
Morshuis, P.H.F. ; van Breen, H.J. ; Smit, J.J. ; Urbani, G.
Author_Institution :
High Voltage Lab., Delft Univ. of Technol., Netherlands
Abstract :
The dielectric response provides information on the physical and chemical structure of a material. For aging processes that affect physically and/or chemically insulating materials, the change in polarization phenomena can be exploited to monitor insulation degradation. One economic way for estimation of the dielectric response are recovery voltage measurements (RVM). Originally, recovery voltage measurements have been used to assess the depolymerization of the paper insulation in transformers. In this paper, it is discussed to what extent RVM can be applied to evaluate the condition of XLPE cables. An adoption of the common RVM test circuit is presented in order to ensure reproducible and meaningful results. Two models have been developed to explain the RVM spectra obtained from unaged cables and a cable containing water trees
Keywords :
XLPE insulation; ageing; insulation testing; power cable insulation; trees (electrical); RVM test circuit; XLPE cables; aging processes; depolymerization; dielectric response; insulation degradation; polarization phenomena; recovery voltage; unaged cables; water trees; Aging; Cables; Chemical processes; Circuit testing; Degradation; Dielectric materials; Dielectrics and electrical insulation; Polarization; Power transformer insulation; Voltage measurement;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-5414-1
DOI :
10.1109/CEIDP.1999.807869