DocumentCode :
3354494
Title :
Internal And External Frontside Electra-optic Voltage Probing Utilizing A Diode Laser
Author :
Thomas, V. ; Russer, P.
Author_Institution :
Technische Universita Munchen
fYear :
1990
fDate :
4-9 Nov 1990
Firstpage :
572
Lastpage :
573
Keywords :
Circuit testing; Conductors; Diode lasers; Gallium arsenide; Laser beams; Optical modulation; Optical sensors; Probes; Surface emitting lasers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN :
0-87942-550-4
Type :
conf
DOI :
10.1109/LEOS.1990.690681
Filename :
690681
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3354494
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