Title :
Recovery/serviceability system test improvements for the IBM ES/9000 520 based models
Author :
Merenda, A.C. ; Merenda, E.
Author_Institution :
IBM, Poughkeepsie, NY, USA
Abstract :
To assist recovery and serviceability testing, the authors dramatically increased the amount of error injection hardware built into the logic of the ES/9000 520 based models. Compare circuits were incorporated into each functional element such that, under program control from either the processor controller or instructions executing on the processor, hardware malfunction conditions could be injected in any element. These hardware malfunctions could be synchronized to occur under a vast majority of the command and data transfer operations that occur during normal machine operation. Also, they combined recovery and serviceability system testing. In system testing, they verified recovery and serviceability with a single fault injection, halving the number of hardware fault injections required.<>
Keywords :
IBM computers; computer testing; fault tolerant computing; mainframes; system recovery; IBM ES/9000 520 based models; error injection hardware; fault tolerance; functional element; hardware malfunction conditions; program control; recovery; serviceability testing; Circuit faults; Circuit testing; Computer errors; Hardware; Logic testing; Manufacturing; Packaging machines; Process control; Software packages; System testing;
Conference_Titel :
Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-8186-2875-8
DOI :
10.1109/FTCS.1992.243588