Title :
Filler concentration effects on losses in silicone based polymeric composites
Author :
Tuncer, Enis ; Gubanski, Stanislaw Michal
Author_Institution :
High Voltage Div., Chalmers Univ. of Technol., Goteborg, Sweden
Abstract :
Silicone polymer based rubber with different concentrations of powdered aluminum trihydrate (ATH) as filler were studied. Dielectric properties χ*(ω)=χ´-iχ´´ were measured at different temperatures using low frequency dielectric spectroscopy technique. Without any ATH filler a classical interfacial relaxation was significant with dominating dc conduction in losses, χ´´. By increasing the concentration of the filler a low frequency dispersion mechanism started to dominated in the relaxation behavior. With adding the filler, the dc conduction first decreased and then increased again after a certain concentration level was passed. This behavior showed that the filler particles acted like scattering centers or traps for conduction when the concentration was low. As the concentration increased the conductivity of the filler particles and of the interface (between filler particles and the polymer matrix) started to dominate the conduction. Master curve shifts of the data also showed Arrhenius type of behavior
Keywords :
electric breakdown; electrical conductivity; filled polymers; silicone rubber insulators; classical interfacial relaxation; conductivity; dielectric properties; dominating dc conduction; filler concentration effects; losses; low frequency dielectric spectroscopy technique; low frequency dispersion mechanism; master curve shifts; powdered aluminum trihydrate; scattering centers; silicone based polymeric composites; silicone polymer based rubber; traps; Conducting materials; Conductivity; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency; Microwave technology; Polymers; Rubber; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-5414-1
DOI :
10.1109/CEIDP.1999.807898