Title :
An optimized broad-band leaf chlorophyll estimator
Author :
Vincini, Massimo ; Frazzi, Ermes
Author_Institution :
Centro Ricerca Analisi geoSpaziale e Telerilevamento, Univ. Cattolica del Sacro Cuore, Piacenza, Italy
Abstract :
A comparison of the sensitivity of several broad-band and narrow-band vegetation indices (VI) to leaf chlorophyll concentration is conduced by the analysis of a large synthetic dataset obtained by using in the direct mode the coupled PROSPECT+SAILH leaf and canopy reflectance models. The newly proposed broad-band OCVI (Optimized Chlorophyll Vegetation Index) outperformed as a leaf chlorophyll estimator at the canopy scale both broad-band (i.e., Green NDVI, Green Simple Ratio) and narrow-band VI (i.e.: TCARI - Transformed Chlorophyll Absorption in Reflectance Index, TCARI/OSAVI ratio - TCARI/Optimized Soil Adjusted VI - and REIP, Red Edge Inflection Position), specifically proposed as leaf chlorophyll estimators, with the exception of the TCARI/OSAVI ratio for some soil/solar elevation conditions. Changes in sensitivity of a VI over the range of chlorophyll concentration are analysed, in addition to traditional regression-based statistics, by using a sensitivity function obtained according to the method proposed by Ji and Peters (2007).
Keywords :
vegetation mapping; REIP; TCARI-OSAVI ratio; Transformed Chlorophyll Absorption in Reflectance Index; broad-band leaf chlorophyll estimator; broad-band optimized chlorophyll vegetation index; broad-band vegetation indices; canopy scale; coupled PROSPECT+SAILH leaf-canopy reflectance models; green NDVI; green simple ratio; leaf chlorophyll concentration; leaf chlorophyll estimators; narrow-band vegetation indices; red edge inflection position; regression-based statistics; sensitivity function; soil-solar elevation conditions; Agriculture; Broadband communication; Green products; Reflectivity; Sensitivity; Soil; Sun; broad-band; leaf chlorophyll; precision agriculture; vegetation indices;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2010.5652782