Mode partition noise in vertical cavity surface emitting lasers

Author

Lee, H.L.T. ; Ram, R.J.

Author_Institution

Res. Lab. of Electron., MIT, Cambridge, MA, USA

fYear

2001

fDate

July 30 2001-Aug. 1 2001

Abstract

In vertical cavity surface emitting lasers (VCSELs), a single longitudinal mode is supported in a cavity that can allow multiple transverse modes. In contrast to edge emitting lasers where multiple modes are longitudinal with nearly identical transverse profile, transverse modes can have significant differences in their coupling efficiency. Hence, mode selective loss (MSL) is easily introduced and mode partition noise (MPN) is more significant to the intensity noise of VCSELs. In this paper, we discuss the relevant time scales of the mode partition dynamics of VCSELs and explain the low frequency dependence of the relative intensity noise (RIN) spectrum.

Keywords

laser cavity resonators; laser modes; laser noise; semiconductor device noise; semiconductor lasers; surface emitting lasers; VCSEL; coupling efficiency; edge emitting lasers; identical transverse profile; intensity noise; low frequency dependence; mode partition dynamics; mode partition noise; mode selective loss; multiple modes; multiple transverse modes; relative intensity noise spectrum; single longitudinal mode; time scales; transverse modes; vertical cavity surface emitting lasers; Charge carrier density; Frequency; Laser modes; Laser noise; Low-frequency noise; Resonance; Steady-state; Surface emitting lasers; Time factors; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Semiconductor Lasers and Applications/Ultraviolet and Blue Lasers and Their Applications/Ultralong Haul DWDM Transmission and Networking/WDM Components, 2001. Digest of the LEOS Summer Topica

Conference_Location

Copper Mountain, CO, USA

Print_ISBN

0-7803-7100-3

Type

conf

DOI

10.1109/LEOSST.2001.941888

Filename

941888