Fouquet, J.E. ; Robbins, V.M. ; Kuo, C.P. ; Fletcher, R.M. ; Osentowski, T.D. ; Rosner, S.J. ; Blum, O.
Author_Institution :
Hewlett-Packard Labs,
fYear :
1990
fDate :
4-9 Nov 1990
Firstpage :
579
Lastpage :
580
Keywords :
Carrier confinement; Charge carrier density; Circuits; Density measurement; Electron traps; Energy measurement; Gain measurement; Photoluminescence; Power measurement; Research and development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
