Title :
Current noise in semiconductor lasers
Author :
Rana, F. ; Mayer, P. ; Ram, R.J.
Author_Institution :
Res. Lab. of Electron., MIT, Cambridge, MA, USA
fDate :
July 30 2001-Aug. 1 2001
Abstract :
We present a detailed model for the current noise in semiconductor hetero-junction lasers and correlate the theoretical results with experimental measurements. The model is fully self-consistent and includes the carrier density fluctuations in the cladding (SCH) regions. The different processes contributing to the current noise are shown.
Keywords :
carrier density; fluctuations; laser theory; semiconductor device models; semiconductor device noise; semiconductor lasers; carrier density fluctuations; cladding regions; current noise; fully self-consistent; semiconductor hetero-junction lasers; semiconductor laser; Charge carrier density; Circuit noise; Current measurement; Fluctuations; Laser modes; Laser noise; Noise measurement; Radiative recombination; Semiconductor device noise; Semiconductor lasers;
Conference_Titel :
Advanced Semiconductor Lasers and Applications/Ultraviolet and Blue Lasers and Their Applications/Ultralong Haul DWDM Transmission and Networking/WDM Components, 2001. Digest of the LEOS Summer Topica
Conference_Location :
Copper Mountain, CO, USA
Print_ISBN :
0-7803-7100-3
DOI :
10.1109/LEOSST.2001.941889
