Title : 
Digital anti-coincidence counting method with emulated live-time of the extending dead-time: 67Ga standardization
         
        
            Author : 
Lee, K.B. ; Lee, Jong Man ; Park, Tae Soon ; Lee, Sang Han
         
        
            Author_Institution : 
Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
         
        
        
        
        
        
            Abstract : 
A new programming algorithm implementing the digital anti-coincidence method has been developed. The algorithm emulates the extendable dead-time scheme and calculate the system live-time by counting the clock pulses of the analog-to-digital converter (ADC). The new live-timed anti-coincidence algorithm applied for the 4πβ(LS)-γ system provides a collateral system for the existing primary radionuclide metrology standard in Korea. Using the anti-coincidence method developed, we measure the activity of the gallium-67 with an uncertainty level 1%. The uncertainty level achieved is comparable to the uncertainty level of coincidence method. The newly developed method provides a valuable alternative for coincidence method in the radionuclide metrology, in case that the coincidence method is not suitable to use for activity standardization of the radionuclide under consideration.
         
        
            Keywords : 
analogue-digital conversion; high energy physics instrumentation computing; liquid scintillation detectors; 67Ga standardization; analog-to-digital converter; clock pulses; digital anti-coincidence counting method; extendable dead-time scheme; liquid scintillation count; primary radionuclide metrology standard; programming algorithm; radionuclide metrology; system live-time; Measurement uncertainty; Standardization; Uncertainty; liquid scintillation count; live-timed beta-gamma anti-coincidence counting; radionuclide standardization;
         
        
        
        
            Conference_Titel : 
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
         
        
            Conference_Location : 
Valencia
         
        
        
            Print_ISBN : 
978-1-4673-0118-3
         
        
        
            DOI : 
10.1109/NSSMIC.2011.6154559