Title :
Multiple signature analysis: a framework for built-in self-diagnostic
Author :
Karpovsky, M.G. ; Chaudhry, S.M. ; Levitin, L.B.
Author_Institution :
Dept. of Electr. Comput. & Syst. Eng., Boston Univ., MA, USA
Abstract :
A framework, based on nonbinary multiple error correcting codes, for built-in self-diagnostics is presented. Novel space-time compressors are proposed for test response compression and fault diagnosis. Fault-detecting and locating capabilities for space-time compressors are analyzed in the case when nonbinary Reed-Solomon codes are used. Fault-masking and diagnosis probabilities for the chip-independent error model are estimated. For this error-model, the fault-masking probabilities are analyzed using the weight distributions of Reed-Solomon codes.<>
Keywords :
Reed-Solomon codes; built-in self test; error correction codes; fault location; logic testing; built-in self-diagnostic; chip-independent error model; fault detection; fault diagnosis; fault location; fault masking; framework; multiple signature analysis; nonbinary Reed-Solomon codes; nonbinary multiple error correcting codes; space-time compressors; test response compression; weight distributions; Automatic testing; Built-in self-test; Circuit faults; Compressors; Electrical fault detection; Error correction codes; Fault detection; Fault diagnosis; Laboratories; System testing;
Conference_Titel :
Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-8186-2875-8
DOI :
10.1109/FTCS.1992.243609
