Title :
Design of fully exercised SFS/SCD logic networks
Author :
Nanya, T. ; Hatakenaka, S. ; Onoo, R.
Author_Institution :
Dept. of Electr. Eng., Tokyo Inst. of Technol., Japan
Abstract :
The authors contribute two important design techniques to the realization of a large logic network that effectively achieves the goal of being totally self-checking. A systematic design method is presented for strongly fault-secure (SFS) and strongly code-disjoint (SCD) sequential circuits which can be used as embedded circuits with the inputs having no need to be monitored by any checker. Second, a remapping technique is presented for embedded logic functions of combinational and sequential circuits interconnected in cascade. The technique allows the embedded input interface of each component circuit to be fully exercised in normal operation so that the entire logic network proves to be SFS and SCD.<>
Keywords :
combinatorial circuits; fault location; logic testing; sequential circuits; combinatorial circuits; embedded circuits; embedded input interface; fully exercised SFS/SCD logic networks; remapping technique; sequential circuits; strongly code-disjoint; strongly fault-secure; totally self-checking; Circuit faults; Circuit synthesis; Combinational circuits; Design methodology; Integrated circuit interconnections; Logic circuits; Logic design; Logic functions; Monitoring; Sequential circuits;
Conference_Titel :
Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-8186-2875-8
DOI :
10.1109/FTCS.1992.243611