Title :
METRIC: tracking down inefficiencies in the memory hierarchy via binary rewriting
Author :
Marathe, Jaydeep ; Mueller, Frank ; Mohan, Tushar ; De Supinski, Bronis R. ; McKee, Sally A. ; Yoo, Andy
Author_Institution :
Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
Abstract :
We present METRIC, an environment for determining memory inefficiencies by examining data traces. METRIC is designed to alter the performance behavior of applications that are mostly constrained by their latency to resolve memory references. We make four primary contributions. First, we present methods to extract partial data traces from running applications by observing their memory behavior via dynamic binary rewriting. Second, we present a methodology to represent partial data traces in constant space for regular references through a novel technique for online compression of reference streams. Third, we employ offline cache simulation to derive indications about memory performance bottlenecks from partial data traces. By exploiting summarized memory metrics, by-reference metrics as well as cache evictor information, we can pin-point the sources of performance problems. Fourth, we demonstrate the ability to derive opportunities for optimizations and assess their benefits in several experiments resulting in up to 40% lower miss ratios.
Keywords :
program compilers; program diagnostics; software metrics; storage management; METRIC; by-reference metrics; cache evictor information; constant space; data traces; dynamic binary rewriting; memory behavior; memory hierarchy inefficiencies; memory inefficiencies; memory references; offline cache simulation; online compression; partial data trace extraction; partial data traces; performance behavior; performance problems; reference streams; running applications; summarized memory metrics; Computational modeling; Computer architecture; Contracts; Delay; Instruments; Laboratories; Large-scale systems; Libraries; Manipulator dynamics; Subcontracting;
Conference_Titel :
Code Generation and Optimization, 2003. CGO 2003. International Symposium on
Print_ISBN :
0-7695-1913-X
DOI :
10.1109/CGO.2003.1191553