Title : 
Numerical simulation of generation in n-SI-n structures
         
        
            Author : 
Viallet, J.E. ; Picoli, Gilbert ; Turki, Kaïs
         
        
            Author_Institution : 
Centre National d´´Etudes des Telecommunications - France
         
        
        
        
        
        
            Keywords : 
Boundary conditions; Charge carrier processes; Doping; Electron traps; Iron; Numerical simulation; Photorefractive effect; Poisson equations; Radiative recombination; Semiconductor materials;
         
        
        
        
            Conference_Titel : 
Semi-Insulating III-V Materials, 1992 Proceedings of the 7th Conference on
         
        
            Print_ISBN : 
0-7503-0242-9
         
        
        
            DOI : 
10.1109/SIM.1992.752719