Title :
Wavelet Shrinkage Estimation for Non-Homogeneous Poisson Process Based Software Reliability Models
Author :
Xiao Xiao ; Dohi, Tadashi
Author_Institution :
Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan
Abstract :
We develop a novel estimation approach for quantitative software reliability by means of wavelet-based technique, where the underlying software reliability model is described by a non-homogeneous Poisson process. Our approach involves some advantages over the commonly used techniques such as maximum likelihood estimation: 1) the wavelet shrinkage estimation enables us to carry out the time-series analysis with high speed and accuracy requirements; and 2) The wavelet shrinkage estimation is classified into a non-parametric estimation without specifying a parametric form of the software intensity function. We consider data-transform-based wavelet shrinkage estimation with four kinds of thresholding schemes for empirical wavelet coefficients to estimate the software intensity function. In numerical experiments with real software-fault count data, we show that our wavelet-based estimation methods can provide better goodness-of-fit performance than not only the conventional maximum likelihood estimation and least squares estimation but also the local likelihood estimation method, in many cases, in spite of their non-parametric nature. Furthermore, we investigate the predictive performance of the proposed methods by employing the so-called one-stage look-ahead prediction method, and estimate some predictive measures such as software reliability.
Keywords :
maximum likelihood estimation; nonparametric statistics; software fault tolerance; stochastic processes; time series; wavelet transforms; Poisson process based quantitative software reliability models; data transform-based wavelet shrinkage estimation; empirical wavelet coefficients; goodness-of-fit performance; maximum likelihood estimation; nonhomogeneous Poisson process; nonparametric estimation; software fault count data; software intensity function; time series analysis; wavelet shrinkage estimation; wavelet-based technique; Maximum likelihood estimation; Software; Software reliability; Wavelet analysis; Wavelet transforms; Goodness-of-fit test; nonhomogeneous Poisson process; nonparametric estimation; one-stage look-ahead prediction; software reliability; wavelet shrinkage estimation;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2013.2240897