DocumentCode :
3355602
Title :
Fast ionization dynistor (FID)-a new semiconductor superpower closing switch
Author :
Efanov, V.M. ; Karavaev, V.V. ; Kardo-Sysoev, A.F. ; Tchashnikov, I.G.
Author_Institution :
A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
Volume :
2
fYear :
1997
fDate :
June 29 1997-July 2 1997
Firstpage :
988
Abstract :
The fastest known semiconductor electrically triggering power closing switches have turn-on times about tens of nanoseconds at /spl sim/1 kV blocking voltage and hundreds of amperes switching current. Any attempts to increase the device voltage lead to the increase of the device thickness and turn-on times. These limitations may be overpassed using the effect of delayed ionization. This effect has been used to develop new power superfast devices-fast ionization dynistors (FID). Like thyristors they have two steady states: nonconducting and high-conducting. The fast (about 1 ns) transition from nonconducting state to high-conducting state is induced by application of short (nanoseconds) high voltage pulse to the blocking p-n junction of multilayer n-p-n-p semiconductor structure. Due to the regenerative feedback, FID may remain in the high-conducting state infinitely.
Keywords :
feedback; ionisation; power semiconductor switches; pulsed power switches; blocking p-n junction; electrically triggering power closing switches; fast ionization dynistor; fast ionization dynistors; high-conducting state; multilayer n-p-n-p semiconductor structure; nonconducting state; regenerative feedback; semiconductor superpower closing switch; Capacitors; Circuits; Current measurement; Delay effects; Inductors; Ionization; Power measurement; Power semiconductor switches; Stability; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location :
Baltimore, MA, USA
Print_ISBN :
0-7803-4213-5
Type :
conf
DOI :
10.1109/PPC.1997.674523
Filename :
674523
Link To Document :
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