DocumentCode :
3355784
Title :
Raman Determination Of Crystallographic Orientation In Silicon On Insulators
Author :
Nakashima, S. ; Takabe, H. ; Mizoguchi, K.
Author_Institution :
Osaka University
fYear :
1990
fDate :
4-9 Nov 1990
Firstpage :
588
Lastpage :
589
Keywords :
Apertures; Cameras; Crystallography; Insulation; Lenses; Physics; Polarization; Raman scattering; Semiconductor films; Silicon on insulator technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN :
0-87942-550-4
Type :
conf
DOI :
10.1109/LEOS.1990.690688
Filename :
690688
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3355784
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