Title :
Jitter in oscillators with 1/f noise sources
Author :
Liu, Chengxin ; McNeill, John A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Worcester Polytech. Inst., MA, USA
Abstract :
A higher 1/f noise corner is introduced in the latest deep sub-micron process. Hence the characterization of jitter due to the 1/f noise becomes crucial for practical applications. This work presents a simple model to relate the time domain jitter and frequency domain phase noise in the presence of 1/f noise sources, and reveals the relationship between the 1/f transition time and the 1/f3 phase noise corner. The measured results from ring oscillators fabricated in a 0.18μprocess show that the error of this simple model is within 10%.
Keywords :
1/f noise; circuit noise; frequency-domain analysis; jitter; phase noise; time-domain analysis; voltage-controlled oscillators; 0.18 micron; 1/f noise sources; 1/f transition time; 1/f3 phase noise corner; deep submicron process; frequency domain phase noise; ring oscillators; time domain jitter; Analytical models; Delay effects; Frequency domain analysis; Jitter; Phase locked loops; Phase noise; Ring oscillators; Time measurement; Voltage-controlled oscillators; White noise;
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
DOI :
10.1109/ISCAS.2004.1328309
