Title :
A programmable cellular automata structure for built-in self-test
Author :
Chowdhury, D. Roy ; Sengupta, I. ; Chaudhuri, P. Pal
Author_Institution :
Indian Institute of Technology
Keywords :
Automatic test pattern generation; Built-in self-test; Character generation; Circuit faults; Circuit testing; Digital circuits; Fault detection; Test pattern generators; Two dimensional displays; Very large scale integration;
Conference_Titel :
TENCON '91.1991 IEEE Region 10 International Conference on EC3-Energy, Computer, Communication and Control Systems
Print_ISBN :
0-7803-0538-8
DOI :
10.1109/TENCON.1991.753860
