DocumentCode
3356336
Title
Comparison between Geant4 and EGSnrc of dosimetric quantities and spectra simulation for electrons beam
Author
Casssola, Vagner F. ; Hoff, Gabriela
Author_Institution
Dept. de Energia Nucl., Univ. Fed. de Pernambuco, Recife, Brazil
fYear
2011
fDate
23-29 Oct. 2011
Firstpage
1398
Lastpage
1400
Abstract
This work aim is to investigate how Geant4 and EGSnrc simulate electrons of energies from 10 keV up to 150 keV. The characterization information is useful for dosimetric interests, especially for thin regions. That way this work presents a comparison of dosimetric quantities, spectra and percentage of electrons transport processes for two different geometries: a spherical and a laminar. For each geometry and situation simulated was collected: the absorbed energy (Eab), the electron flux (spectra), the continuous slowing down approximation (CSDA) and the percentage of process of transport. This is a work that is been developed, but the preliminary results show for electrons of energies under 150kV, no significant differences on calculation of CSDA and significant differences for dose simulates for thin layer on spherical geometry. The evaluation of Eab and CSDA for different layer thickness united to study of electron flux (spectra) and the percentage of process of transport can offer and explanation for the differences and similarities found between the Monte Carlo toolkits evaluated as well help us to define the best option for applications that needs electrons of kinetic energy under 150 keV.
Keywords
dosimetry; high energy physics instrumentation computing; particle beam diagnostics; CSDA calculation; EGSnrc dosimetric quantity; Geant4 dosimetric quantity; Monte Carlo toolkits; absorbed energy; continuous slowing down approximation; electron flux; electron volt energy 10 keV to 150 keV; electrons beam; electrons transport processes; spectra simulation; spherical geometry; NIST;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location
Valencia
ISSN
1082-3654
Print_ISBN
978-1-4673-0118-3
Type
conf
DOI
10.1109/NSSMIC.2011.6154626
Filename
6154626
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