Title :
Diagnostics of the soft X-ray emission in a plasma focus device
Author :
Gasparyan, P.D. ; Demin, A.N. ; Subbotin, A.N. ; Usenko, P.L.
Author_Institution :
Fed. Nucl. Center, Nizhni Novgorod, Russia
fDate :
June 29 1997-July 2 1997
Abstract :
Experimental results of the soft X-ray spectra investigation from a hot plasma produced by impulse discharge of a dense plasma focus in pure neon are presented. The spectral-energy characteristics of X-ray emission were measured in the photon energy range of 0.5-5.0 keV with the help of thin absorber filters set and silicon semiconductor p-i-n detectors SPPD11-04. A study was made at the filling gas pressure P/sub Ne/=2.0-6.0 Torr and at the stored capacitor bank energy W=15-21 kJ. A high degree of monochromatization for the soft X-ray emission (/spl sim/90 %) was obtained. According to the experimental data characteristic plasma electron temperature in the time duration of X-ray pulse /spl tau//sub 1/2/=10-100 ns has been estimated as T/sub e//spl sim/0.2-0.3 keV. The plasma parameters obtained are compared with the results of computer simulation of the emission process.
Keywords :
X-ray emission spectra; capacitor storage; discharges (electric); plasma diagnostics; plasma focus; plasma temperature; 0.2 to 0.3 keV; 0.5 to 5 keV; 10 to 100 ns; 15 to 21 kJ; 2 to 6 torr; SPPD11-04; absorber filters; computer simulation; dense plasma focus; emission process; filling gas pressure; hot plasma; impulse discharge; monochromatization; photon energy range; plasma electron temperature; plasma focus device; pure neon; silicon semiconductor p-i-n detectors; soft X-ray emission diagnostics; spectral-energy characteristics; stored capacitor bank energy; time duration; Energy measurement; Filters; Plasma density; Plasma devices; Plasma diagnostics; Plasma measurements; Plasma properties; Plasma simulation; Plasma temperature; Plasma x-ray sources;
Conference_Titel :
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location :
Baltimore, MA, USA
Print_ISBN :
0-7803-4213-5
DOI :
10.1109/PPC.1997.674527
