Title :
Error probabilities of fast frequency-hopped FSK with ratio-statistic combining in a fading channel with partial-band interference
Author :
Robertson, R. Clark ; Riley, John F. ; Ha, Tri T.
Author_Institution :
Dept. of Electr. & Comput. Eng., US Naval Postgrad. Sch., Monterey, CA, USA
Abstract :
An error probability analysis is performed for a fast frequency-hopped, noncoherent binary frequency-shift keying (FSK) receiver using ratio-statistic combining. The channel is assumed to be a frequency nonselective, slowly fading Rician channel with partial-band interference. Both envelope and quadratic detectors are analyzed. The bit error probability is examined for different levels of diversity, severity of fading, fraction of bandwidth jammed, levels of jamming power, and thermal noise. For Gaussian and Rician channels, the ratio-statistic circuit provides complete immunity to partial-band interference provided sufficient diversity is used. For Rayleigh channels, partial-band interference has very little effect on overall performance, and the ratio-statistic receiver offers little improvement over a comparable conventional demodulator
Keywords :
error statistics; fading; frequency agility; frequency shift keying; probability; radio receivers; radiofrequency interference; telecommunication channels; FSK receiver; Gaussian channel; bandwidth; bit error probability; diversity; envelope detectors; fast frequency-hopped; frequency nonselective fading; jamming power; noncoherent binary frequency-shift keying; partial-band interference; quadratic detectors; ratio-statistic circuit; ratio-statistic combining; ratio-statistic receiver; slowly fading Rician channel; thermal noise; Diversity reception; Error analysis; Error probability; Fading; Frequency shift keying; Interference; Jamming; Performance analysis; Rayleigh channels; Rician channels;
Conference_Titel :
Military Communications Conference, 1992. MILCOM '92, Conference Record. Communications - Fusing Command, Control and Intelligence., IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0585-X
DOI :
10.1109/MILCOM.1992.243983