Title :
Study of radiation damage in SrI2 for 90Sr based betabatteries
Author :
Rensing, Noa M. ; Tiernan, T.C. ; Shirwadkar, Urmila ; Freed, Sara ; O´Dougherty, Patrick ; Squillante, Michael R.
Author_Institution :
Radiat. Monitoring Devices, Inc., Watertown, MA, USA
Abstract :
Betabatteries can provide long term power in applications where there is no access to other energy sources, for example space exploration, deep see sensors, and implantable devices. Traditional betabattery approaches suffer from two significant limitations: radiation damage in the semiconductor diode severely limits their lifetime, and self absorption in the source places an upper limit on the strength of the source. We are developing a device that overcomes both problems using a novel approach based on a scintillator grown with beta emitting atoms in its crystal structure. We present the results of electron beam induced radiation damage in the scintillators which is the limiting factor on the practical lifetime of a 90Sr/SrI2 based betabattery.
Keywords :
crystal structure; electron beam effects; primary cells; semiconductor diodes; solid scintillation detectors; strontium compounds; 90Sr practical lifetime; SrI2; Srl2 practical lifetime; betabatteries; crystal structure; deep see sensors; energy sources; implantable devices; radiation damage; radiation damage study; semiconductor diode; space exploration; Atomic beams; Atomic measurements; Heating; Phosphors;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154632