Title :
Shape Invariants Of Reflectional Symmetry From Elliptic Fourier Descriptors Under Parallel Projection
Author :
Yip, R.K.K. ; Tam, P.K.S. ; Leung, D.N.K. ; Chan, R.H.T.
Author_Institution :
Hong Kong Polytechnic
Keywords :
Clocks; Computer vision; Geometry; Image reconstruction; Layout; Object recognition; Pattern analysis; Pattern recognition; Shape measurement;
Conference_Titel :
TENCON '91.1991 IEEE Region 10 International Conference on EC3-Energy, Computer, Communication and Control Systems
Print_ISBN :
0-7803-0538-8
DOI :
10.1109/TENCON.1991.753901
