Title :
The origins of image contrast in SEAM of ferroelectric semiconductor, ceramics and single crystal: BaTiO3
Author :
Zhang, Bingyang ; Yang, Yang ; Jiang, Fuming ; Yin, Qingnti
Author_Institution :
Inst. of Ceramics, Acad. Sinica, Shanghai, China
Abstract :
A relatively new imaging technique, scanning electron-acoustic microscope (SEAM), was used to investigate the ferroelectric semiconductors, ferroelectric ceramics and single crystal: BaTiO3 . The subsurface defects of ferroelectric semiconductors and the domain structures of ferroelectric ceramics and single crystal were observed without any pre-handling to the samples in the electron-acoustic imaging of these materials. The origins of image contrast in SEAM of these materials have been discussed based on differently experimental conditions
Keywords :
acoustic microscopy; barium compounds; ceramics; electric domains; ferroelectric semiconductors; scanning electron microscopy; BaTiO3; SEAM; ceramic; domain structure; ferroelectric semiconductor; image contrast; scanning electron-acoustic microscopy; single crystal; subsurface defects; Acoustic imaging; Acoustic waves; Ceramics; Crystalline materials; Electron beams; Ferroelectric materials; Grain boundaries; Scanning electron microscopy; Semiconductor materials; Surface acoustic waves;
Conference_Titel :
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-2695-4
DOI :
10.1109/ISE.1996.578221
