Title :
Simple chip combining metric improvements for anti-jam applications
Author_Institution :
Mitre Corp., Bedford, MA, USA
Abstract :
A simple characteristic metric is demonstrated to provide antijam performance gain for chip-combining. This metric makes use of likely signal and jammer characteristics. The specific application discussed is an 8-ary FSK, FH (frequency-shift-keying, frequency-hopped) system with noncoherent envelope detection and four-chip combining. Performance is calculated in the form of bit error rate (BER) vs. signal-to-noise ratio (SNR), for various jamming levels and metric adjustments. It was found that a processing gain appreciable even for small jammer-to-signal ratios (J/S), and very effective for large J/S scenarios, can be generated
Keywords :
frequency agility; frequency shift keying; jamming; signal processing; 8-ary FSK; BER; FH system; SNR; antijam performance gain; bit error rate; characteristic metric; chip combining; frequency-hopped; frequency-shift-keying; jammer characteristics; jammer-to-signal ratios; noncoherent envelope detection; processing gain; signal characteristics; signal-to-noise ratio; AWGN; Additive white noise; Bit error rate; Decoding; Envelope detectors; Frequency shift keying; Jamming; Narrowband; Semiconductor device measurement; Signal to noise ratio;
Conference_Titel :
Military Communications Conference, 1992. MILCOM '92, Conference Record. Communications - Fusing Command, Control and Intelligence., IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0585-X
DOI :
10.1109/MILCOM.1992.244008
