Title :
Detection of soft X-rays with the pixel detector Timepix operated as a highly sensitive dark-current free CCD-like camera
Author :
Krejci, Frantisek ; Kroupa, Martin ; Jakubek, Jan ; Bruza, Petr ; Panek, Dalibor
Author_Institution :
Inst. of Exp. & Appl. Phys., Czech Tech. Univ. in Prague, Prague, Czech Republic
Abstract :
The hybrid semiconductor pixel device Timepix consists of a sensor (e.g. silicon 300 μm thick) bump-bonded to a pixelated ASIC readout chip (256 × 256 square pixels with pitch of 55 μm). In the Time-over-Threshold mode (TOT) the detector enables the direct energy measurement in each pixel. The advantage of noiseless position sensitive detection combined with per pixel spectroscopic capability opens many new applications, which were till now, however, restricted to detection of radiation which is basically above the detector threshold (typically 4 keV). This limitation excludes application of the hybrid technology to highly interesting fields such as plasma diagnostics or X-ray microscopy. In this contribution we demonstrate how the Timepix detector working in TOT mode can be operated as a detector for soft X-ray photons with energy typically 0.5 keV (i.e. for particles which are in principle below the detector threshold). The approach is based on the detection of a larger number of photons incoming in the pixel read-out chain in a time significantly shorter than the shaping time of the pixel electronics. The proposed approach enables a CCD-like operation with many advantages of the hybrid counting technology (high sensitivity, dark-current free operation, enhanced signal-to-noise ratio). Using the proposed approach we demonstrate single-shot soft X-ray imaging with a laser-induced plasma source and the characterization of the source itself.
Keywords :
X-ray apparatus; X-ray detection; application specific integrated circuits; nuclear electronics; plasma X-ray sources; plasma diagnostics; semiconductor counters; CCD like camera; CCD like operation; Timepix pixel detector; bump bonded silicon sensor; dark current free camera; dark current free operation; direct energy measurement; highly sensitive camera; hybrid counting technology; hybrid semiconductor pixel device; laser induced plasma source; noiseless position sensitive detection; pixel electronics shaping time; pixel read out chain; pixelated ASIC readout chip; signal-noise ratio; single shot soft X-ray imaging; soft X-ray detection; time over threshold mode; Gas lasers; Iron; Laser applications; Laser beams; Laser excitation; Pulse measurements; Thickness measurement;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154665