DocumentCode :
3357315
Title :
The Influence Of Substrate Defects And Substrate Surface Quality On The Optical And Electrical Properties Of Epitaxial InGaAs:InP
Author :
Miner, C.J. ; Knight, D.G. ; Watt, B. ; Blaauw, C. ; Puetz, N.
Author_Institution :
Bell-Northern Research
fYear :
1990
fDate :
4-9 Nov 1990
Firstpage :
615
Lastpage :
616
Keywords :
Buffer layers; Cleaning; Epitaxial layers; Indium gallium arsenide; Indium phosphide; MOCVD; Optical buffering; Photoluminescence; Spatial resolution; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN :
0-87942-550-4
Type :
conf
DOI :
10.1109/LEOS.1990.690697
Filename :
690697
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3357315
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