Title :
A Hierarchical Data Structure To Support Diagnostic Testing
Author_Institution :
Rockwell international
Keywords :
Circuit analysis; Circuit simulation; Circuit testing; Data mining; Data structures; Integrated circuit measurements; Integrated circuit testing; Object oriented modeling; Sampling methods; Voltage;
Conference_Titel :
Signals, Systems and Computers, 1988. Twenty-Second Asilomar Conference on
DOI :
10.1109/ACSSC.1988.754023
