Title :
A new concept for quantitative nanoscale imaging with magnetic contrast: Synchrotron x-ray enhanced scanning tunneling microscopy
Author :
Rose, Volker ; Freeland, John W.
Author_Institution :
Adv. Photon Source, Argonne Nat. Lab., Argonne, IL, USA
Abstract :
The combination of synchrotron x-rays with scanning tunneling microscopy provides a promising new path towards the imaging of nanoscale structures with chemical, electronic, and magnetic contrast. While a scanning probe provides the high spatial resolution measuring x-ray magnetic circular dichroism allows the direct quantification of magnetic moments. This capability has the potential to broaden and deepen the general understanding of nanomagnetism.
Keywords :
X-ray microscopy; dichroism; scanning tunnelling microscopy; synchrotron radiation; X-ray magnetic circular dichroism; magnetic contrast; magnetic moments; nanomagnetism; nanoscale structures; quantitative nanoscale imaging; synchrotron X-ray enhanced scanning tunneling microscopy; Magnetic force microscopy; Magnetic resonance imaging; Magnetic tunneling; Scanning electron microscopy; X-ray imaging;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-7366-3
DOI :
10.1109/ICEAA.2010.5652963
