Title :
Reliability by design a tool to reduce time-to-market
Author :
Foo, S.W. ; Lien, W.L. ; Xie, M. ; van Geest, E.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Abstract :
Reliability of products plays a crucial role in retaining brand loyalty. The conventional approach to reliability analysis resorts to testing the prototype and entails long development time. This is undesirable for electronic products which have very short life cycle. Reliability by design using the stressor-susceptibility interaction model provides a way to address this dilemma. Management no longer have to forgo reliability analysis in the race to shorten time-to-market
Keywords :
consumer electronics; product development; quality control; reliability theory; research and development management; R&D; development time; electronic products; life cycle; management; product reliability; reliability analysis; reliability by design; stressor-susceptibility interaction model; time-to-market; Circuit analysis computing; Consumer electronics; Design engineering; Integrated circuit reliability; Product development; Prototypes; Reliability engineering; Research and development management; Testing; Time to market;
Conference_Titel :
Engineering Management Conference, 1995. Global Engineering Management: Emerging Trends in the Asia Pacific., Proceedings of 1995 IEEE Annual International
Print_ISBN :
0-7803-2799-3
DOI :
10.1109/IEMC.1995.524588
