DocumentCode :
3358266
Title :
Analytical analysis of effect of sampling plan on Cpk
Author :
Liu, X.Q.
Author_Institution :
Dept. of Quality & Reliability Assurance, AT&T Microelectron. Pte. Ltd., Singapore
fYear :
1995
fDate :
28-30 Jun 1995
Firstpage :
257
Lastpage :
259
Abstract :
The use and abuse of process capability indices (PCIs) have become topics of considerable controversy in the last few years. A simulation shows that the difference in Cpk´s estimated by three approaches, which are widely used in manufacturing industry, is at least 0.5. In this paper, the authors study analytically the differences in Cpk´s calculated by these three different approaches. A few analytical relationships among the Cpk´s are derived in this paper and are illustrated with a case study
Keywords :
management; manufacturing industries; quality control; Cpk; case study; manufacturing industry; process capability indices; quality management; sampling plan; simulation; Computational modeling; Control charts; Manufacturing industries; Microelectronics; Process control; Random number generation; Research and development management; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering Management Conference, 1995. Global Engineering Management: Emerging Trends in the Asia Pacific., Proceedings of 1995 IEEE Annual International
Print_ISBN :
0-7803-2799-3
Type :
conf
DOI :
10.1109/IEMC.1995.524589
Filename :
524589
Link To Document :
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