Title :
[Society related material]
Author :
Subramanian, Venkatachalam
Author_Institution :
EECS, Univ. of California at Berkeley, Berkeley, CA
Abstract :
There has been significant interest in the applications of printed electronics in the realization of fully-printed RFID tags and embedded sensors. Printing of active circuitry is expected to enable a dramatic reduction in the overall cost of these systems, allowing for integration of electronic barcodes and product quality detection systems into consumer goods. In this talk, I will review our work on developing materials, processes, devices, and circuit architectures for all-printed RFID and tags, and, based on these results, will evaluate the likely system constraints that will define such fully printed systems. We have already realized a full range of printable transistors, diodes, passive components, and memories suitable for use in RFID applications. Performance of these components is rapidly approaching the requisite levels for realization of simple RF Barcodes. Based on robust models we have developed for our devices, I will review the circuit implications of the same and will review the likely topology and performance limits associated with fully printed RFID. Furthermore, I will review or work on developing a range of chemical and biosensors for use in low cost product quality monitoring and biosensing applications.
Keywords :
CMOS integrated circuits; intelligent sensors; printed circuits; radiofrequency identification; CMOS scaling; RF Barcodes; RFID applications; all-printed RFID; all-printed tags; biosensing applications; circuit architectures; consumer goods; diodes; electronic barcodes; embedded sensors; fully-printed RFID tags; low cost product quality monitoring; low-cost sensors; low-cost tags; memories; passive components; printable transistors; printed electronics; printed systems; product quality detection systems; Conferences; Frequency control; Frequency conversion; Frequency measurement; MOSFET circuits; Performance evaluation; Silicon;
Conference_Titel :
Microelectronics and Electron Devices, 2008. WMED 2008. IEEE Workshop on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4244-2343-9
DOI :
10.1109/WMED.2008.4510645