• DocumentCode
    3358791
  • Title

    Nanowire addressing in the face of uncertainty

  • Author

    Rachlin, E. ; Savage, J.E.

  • Author_Institution
    Dept. of Comput. Sci., Brown Univ., USA
  • fYear
    2006
  • fDate
    2-3 March 2006
  • Abstract
    Exploiting the high-potential of nanoscale architectures requires that they be controlled by CMOS technology. Such an interface, a decoder, must control many nanowires (NWs) with a small number of meso-scale wires (MWs). Multiple types of decoder have been proposed, each of which can be modelled as embedding resistive switches in NWs. In this paper we present a general model for NW decoders and use it to specify the criteria they must meet to function correctly and be fault-tolerant. To illustrate the power of our model, we derive the first bounds on the size of a fault-tolerant randomized contact decoder.
  • Keywords
    decoding; nanoelectronics; nanowires; switches; CMOS technology; NW decoders; fault tolerant computing; meso-scale wires; nanoscale architectures; nanowire decoder; Assembly; CMOS technology; Circuits; Decoding; Fault tolerance; Lithography; Semiconductor device modeling; Switches; Uncertainty; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging VLSI Technologies and Architectures, 2006. IEEE Computer Society Annual Symposium on
  • Conference_Location
    Karlsruhe
  • Print_ISBN
    0-7695-2533-4
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2006.66
  • Filename
    1602444