DocumentCode
3358796
Title
Talk: NAND Flash Memory Scaling - Key Challenges and Future Outlook
Author
Parat, K.
Author_Institution
NAND scaling, Intel Corp., Santa Clara, CA
fYear
2008
fDate
18-18 April 2008
Abstract
Summary form only given. NAND flash memory is the memory of choice in many of the handheld devices owing to the versatility of the NAND flash in terms of non-volatility, updateability, fast read/write throughput, large density, low cost, and high reliability. NAND flash bit area/density has scaled by >1000times in the past 10 years. However, there are several scaling issues - some physical and some electrical - that need to be overcome to continue the same rate of scaling into the future. The presentation will discuss some of these scaling challenges along with potential solutions.
Keywords
NAND circuits; flash memories; NAND flash memory scaling; handheld electronic devices; Computer architecture; Conferences; Electric potential; Electrical engineering; Flash memory; Microprocessors; Nonvolatile memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics and Electron Devices, 2008. WMED 2008. IEEE Workshop on
Conference_Location
Boise, ID
Print_ISBN
978-1-4244-2343-9
Type
conf
DOI
10.1109/WMED.2008.4510647
Filename
4510647
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