DocumentCode :
3358796
Title :
Talk: NAND Flash Memory Scaling - Key Challenges and Future Outlook
Author :
Parat, K.
Author_Institution :
NAND scaling, Intel Corp., Santa Clara, CA
fYear :
2008
fDate :
18-18 April 2008
Abstract :
Summary form only given. NAND flash memory is the memory of choice in many of the handheld devices owing to the versatility of the NAND flash in terms of non-volatility, updateability, fast read/write throughput, large density, low cost, and high reliability. NAND flash bit area/density has scaled by >1000times in the past 10 years. However, there are several scaling issues - some physical and some electrical - that need to be overcome to continue the same rate of scaling into the future. The presentation will discuss some of these scaling challenges along with potential solutions.
Keywords :
NAND circuits; flash memories; NAND flash memory scaling; handheld electronic devices; Computer architecture; Conferences; Electric potential; Electrical engineering; Flash memory; Microprocessors; Nonvolatile memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics and Electron Devices, 2008. WMED 2008. IEEE Workshop on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4244-2343-9
Type :
conf
DOI :
10.1109/WMED.2008.4510647
Filename :
4510647
Link To Document :
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