• DocumentCode
    3358796
  • Title

    Talk: NAND Flash Memory Scaling - Key Challenges and Future Outlook

  • Author

    Parat, K.

  • Author_Institution
    NAND scaling, Intel Corp., Santa Clara, CA
  • fYear
    2008
  • fDate
    18-18 April 2008
  • Abstract
    Summary form only given. NAND flash memory is the memory of choice in many of the handheld devices owing to the versatility of the NAND flash in terms of non-volatility, updateability, fast read/write throughput, large density, low cost, and high reliability. NAND flash bit area/density has scaled by >1000times in the past 10 years. However, there are several scaling issues - some physical and some electrical - that need to be overcome to continue the same rate of scaling into the future. The presentation will discuss some of these scaling challenges along with potential solutions.
  • Keywords
    NAND circuits; flash memories; NAND flash memory scaling; handheld electronic devices; Computer architecture; Conferences; Electric potential; Electrical engineering; Flash memory; Microprocessors; Nonvolatile memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Electron Devices, 2008. WMED 2008. IEEE Workshop on
  • Conference_Location
    Boise, ID
  • Print_ISBN
    978-1-4244-2343-9
  • Type

    conf

  • DOI
    10.1109/WMED.2008.4510647
  • Filename
    4510647