Title :
Finite state machine implementation with single-electron tunneling technology
Author :
Jialin Mi ; Chunhong Chen
Author_Institution :
Dept. of Electr. & Comput. Eng., Windsor Univ., Ont.
Abstract :
In this paper we propose an implementation technique for finite state machines using single-electron tunneling (SET) technology towards ultra-low power dissipation. We take an example from radio-frequency identification (RFID) systems, and implement the state machine based on single-electron encoded logic (SEEL). The circuit is simulated by SIMON (a simulator for SET circuits), and is compared favorably with its CMOS counterpart
Keywords :
finite state machines; logic circuits; logic design; low-power electronics; radiofrequency identification; single electron devices; RFID systems; SEEL; SET circuits; SET technology; circuit simulation; finite state machine; radio-frequency identification systems; single-electron encoded logic; single-electron tunneling technology; ultra-low power dissipation; Automata; CMOS logic circuits; CMOS technology; Circuit simulation; Electrons; Logic design; Power dissipation; Radiofrequency identification; Tunneling; Voltage;
Conference_Titel :
Emerging VLSI Technologies and Architectures, 2006. IEEE Computer Society Annual Symposium on
Conference_Location :
Karlsruhe
Print_ISBN :
0-7695-2533-4
DOI :
10.1109/ISVLSI.2006.45
