Title :
X-ray based methods for 3D characterization of charge collection and homogeneity of sensors with the use of Timepix chip
Author :
Zemlicka, Jan ; Jakubek, Jan ; Jakubek, Martin ; Vykydal, Zdenek ; Chelkov, Georgy A. ; Kruchonok, Vladimir G. ; Elkin, Vladimir G. ; Fiederle, Michael ; Fauler, Alex ; Tolbanov, Oleg P. ; Tyazhev, Anton V. ; Visser, Jan
Author_Institution :
Inst. of Exp. & Appl. Phys., CTU in Prague, Prague, Czech Republic
Abstract :
Timepix is a universal readout chip for pixel detectors which can be connected to various semiconductor sensors. The device has a 256×256 matrix of square pixels with a pitch of 55 μm. Every single pixel is able to measure the collected charge. The traditional material used for sensors is mono-crystalline silicon (Si). However, other materials such as gallium arsenide (GaAs) or cadmium telluride (CdTe) are applicable as well. To describe the properties of the sensors it is important to probe and evaluate the charge collection efficiency and its homogeneity across sensor area (or if possible even in its volume).
Keywords :
nuclear electronics; readout electronics; silicon radiation detectors; Timepix chip; X-ray based methods; X-ray radiation; cadmium telluride; charge collection characterization; gallium arsenide; monocrystalline silicon; pixel detectors; semiconductor sensors; sensor homogeneity; universal readout chip; Electron tubes; Instruments; Silicon; Software; Visualization;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154764