DocumentCode :
3358850
Title :
A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process
Author :
Tanaka, Genichi ; Takeuchi, Kan ; Ito, Minoru ; Matsushita, Hiroaki
Author_Institution :
Renesas Technol. Corp., Itami
fYear :
2008
fDate :
21-24 Sept. 2008
Firstpage :
37
Lastpage :
40
Abstract :
An efficient crosstalk delay degradation measurement method with a 65 nm process is proposed. The voltage drop impact on the crosstalk delay is measured. The test module incorporates filters which omit glitches high speed complicated circuits unintentionally create. The module consists of standard cells only, that makes designing very easy. An intensive comparison of measured results with simulations for 64 times 216 patterns of six aggressor activations (timing and combinations) shows precise matching with less than 10% errors.
Keywords :
integrated circuit measurement; integrated circuit noise; integrated circuit reliability; integrated circuit testing; aggressor activations; crosstalk delay degradation; crosstalk measurement; integrated circuit reliability; integrated circuit testing; voltage drop; Circuit noise; Circuit testing; Crosstalk; Delay effects; Filters; Frequency measurement; Ring oscillators; Time measurement; Timing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2018-6
Electronic_ISBN :
978-1-4244-2019-3
Type :
conf
DOI :
10.1109/CICC.2008.4672015
Filename :
4672015
Link To Document :
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