Title :
Application of nanosecond X-radiation generators in X-ray examination
Author :
Filatov, A.L. ; Kotov, Y.A. ; Korzhenevski, S.R. ; Scherbinin, SV
Author_Institution :
Inst. of Electrophys., Acad. of Sci., Ekaterinburg, Russia
fDate :
June 29 1997-July 2 1997
Abstract :
We present results of flaw detection tests of compact nanosecond X-radiation pulsers. For a generator with an output voltage of 240 kV, we have obtained computer images of steel parts up to 20 mm thick. Using a sharp-focus X-ray tube makes it possible to obtain a images of small objects such as X-ray stereographs of integrated circuits with ten-fold magnification.
Keywords :
X-ray applications; X-ray production; X-ray tubes; flaw detection; power supplies to apparatus; pulse generators; pulsed power technology; 20 mm; 240 kV; X-ray examination; X-ray stereographs; computer images; flaw detection tests; integrated circuits; nanosecond X-radiation generators; sharp-focus X-ray tube; steel parts; ten-fold magnification; Circuit testing; Diodes; Electron beams; Focusing; Frequency; Instruments; Pulse generation; Steel; Voltage; X-ray imaging;
Conference_Titel :
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location :
Baltimore, MA, USA
Print_ISBN :
0-7803-4213-5
DOI :
10.1109/PPC.1997.674543
