Title :
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images
Author :
Stellari, Franco ; Song, Peilin ; Diemoz, Timothy E. ; Weger, Alan J. ; Vogel, Tami ; Wilson, Steven C. ; Pennings, John ; Rizzolo, Richard F.
Author_Institution :
IBM TJ. Watson Res. Center, Yorktown Heights, NY
Abstract :
In this paper, the paper discuss a diagnostics methodology based on the combined use of advanced chip cooling technology and high-resolution time-integrated images of the light emission due to off-state leakage current (LEOSLC). The methodology was successfully applied to the debug of an IBM microprocessor chip fabricated in the 90 nm SOI technology generation
Keywords :
computer debugging; cooling; microprocessor chips; nanotechnology; phase locked loops; silicon-on-insulator; 90 nm; IBM microprocessor chip; SOI technology generation; advanced chip cooling technology; emission images; high-power PLL diagnostics; high-resolution images; high-voltage PLL diagnostics; light emission; microprocessor chip debug; nanotechnology; off-state leakage current; time-integrated images; Circuit testing; Cooling; Leakage current; Logic circuits; Logic testing; Microprocessor chips; Phase locked loops; Semiconductor device measurement; Space technology; Temperature;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297625
