High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images

Author

Stellari, Franco ; Song, Peilin ; Diemoz, Timothy E. ; Weger, Alan J. ; Vogel, Tami ; Wilson, Steven C. ; Pennings, John ; Rizzolo, Richard F.

Author_Institution

IBM TJ. Watson Res. Center, Yorktown Heights, NY

fYear

2006

fDate

Oct. 2006

Firstpage

1

Lastpage

10

Abstract

In this paper, the paper discuss a diagnostics methodology based on the combined use of advanced chip cooling technology and high-resolution time-integrated images of the light emission due to off-state leakage current (LEOSLC). The methodology was successfully applied to the debug of an IBM microprocessor chip fabricated in the 90 nm SOI technology generation

Keywords

computer debugging; cooling; microprocessor chips; nanotechnology; phase locked loops; silicon-on-insulator; 90 nm; IBM microprocessor chip; SOI technology generation; advanced chip cooling technology; emission images; high-power PLL diagnostics; high-resolution images; high-voltage PLL diagnostics; light emission; microprocessor chip debug; nanotechnology; off-state leakage current; time-integrated images; Circuit testing; Cooling; Leakage current; Logic circuits; Logic testing; Microprocessor chips; Phase locked loops; Semiconductor device measurement; Space technology; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2006. ITC '06. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

1-4244-0292-1

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2006.297625

Filename

4079303