Title :
A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior
Author :
Desineni, R. ; Poku, O. ; Blanton, R. D Shawn
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
Abstract :
DIAGNOSIX is a comprehensive fault diagnosis methodology for characterizing failures in digital ICs. Using limited layout information, DIAGNOSIX automatically extracts a fault model for a failing IC by analyzing the behavior of the physical neighborhood surrounding suspect lines. Results from several simulated and over 800 failing ICs reveal a significant improvement in localization. More importantly, the output of DIAGNOSIX is an accurate model of the logic-level defect behavior that provides useful insight into the actual defect mechanism. Experiment results for the failing chips with successful physical failure analysis reveal that the extracted faults accurately describe the actual defects
Keywords :
digital integrated circuits; failure analysis; fault diagnosis; integrated circuit modelling; DIAGNOSIX; accurate defect behavior extraction; accurate defect behavior localization; automatic extraction; digital integrated circuit; failure analysis; fault diagnosis; fault model; layout information; logic diagnosis; logic-level defect behavior; Bridge circuits; Circuit faults; Data mining; Failure analysis; Fault diagnosis; Integrated circuit layout; Integrated circuit modeling; Integrated circuit yield; Logic; Signal processing;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297627
