DocumentCode :
3359379
Title :
A Novel Ganged DAC Solution for Multi-Site Testing
Author :
Kwan, Joseph ; Zhao, Qing
Author_Institution :
Texas Instruments, Dallas, TX
fYear :
2006
fDate :
Oct. 2006
Firstpage :
1
Lastpage :
6
Abstract :
Testing of two current steering DACs for wireless communication devices with one digitizer in a single test to reduce test time and minimize the tester resources requirement is proposed. In addition, a new method to test the amplitude mismatch and phase mismatch between the two DACs is further developed on this proposed testing approach. The test results are presented and their applicability for production test is also discussed in this paper
Keywords :
analogue-digital conversion; digital-analogue conversion; mobile communication; production testing; DAC testing; amplitude mismatch; current steering; digitiser; ganged DAC solution; multisite testing; phase mismatch; production testing; wireless communication devices; Distortion measurement; Instruments; Noise measurement; Phase measurement; Production; Switches; Testing; USA Councils; Voltage; Wireless communication; DAC testing; current steering DAC; magnitude mismatch; phase mismatch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2006.297629
Filename :
4079307
Link To Document :
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